Category Archives: Commercial

Coventor SEMulator3D 7.0

EE Journal has an overview of new features Coventor SEMulator3D 7.0. Which incorporates new simulation and meshing capabilities.

https://www.eejournal.com/article/five-major-adds-by-coventor/

They discuss new RC extraction for circuit simulation. In addition, they also discuss new 3D meshing export, as well as a built-in TCAD device simulation feature.

Genius Device Simulator new release July 2015

Cogenda has a new device simulator release. Features include:

  • New solver for Total-Ionizing Dose (TID) effect.
  • Support simulation of x-ray pulse (dose-rate) effect.
  • Updated material models: diamond, 4H-SiC, GaAsSb, GaP, etc.
  • New VTK data structure to store field values on both sides of an interface in VTK files.
  • Support trap and other customer field definition in TIF files.
  • Added cylindrical mesh generator for modeling devices such as particle detectors.
  • Import several TIF mesh files at a time.
  • and they seem to have incorporated some bug fixes into their simulator. More info is available at http://www.cogenda.com

    New Genius Device Simulator Release

    There was a new release of the Genius Device Simulator on March 22, 2014 as part of Cogenda’s Visual TCAD suite of tools. From their website:

    http://cogenda.com/article/Release-Notes-VisualTCAD

    • Density-Gradient Model for inversion layer in MOSFET’s
    • Schur-complement numerical solver for Device Circuit Simulation
    • Improved impact-ionization model
    • Self-consistent gate tunneling current mode
    • Mobility and other material property models which matches with another popular TCAD tool
    • 3D analysis of satellite internal-charging problem.
    • minor features and bug fixes

    This is their first release of a public update in over a year. I’m looking forward to their update of their open source version of their project at http://github.com/cogenda/Genius-TCAD-Open